- Core Solutions
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Targeting bonding challenges in MicroLED manufacturing, iSABers offers full-process bonding solutions covering multiple technology routes such as flip-chip bonding, room-temperature bonding, and hybrid bonding, meeting the mass production requirements of various applications including pixel vehicle light, AR displays, and optical communications.
Core Process 1:C2C/C2W Flip-chip Bonding

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Process Capability
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Eutectic bonding (Au-Sn, Au-In) or metal bonding (Au-Au, Cu-Cu) for flip-chip interconnection between LED chips and CMOS wafers.
Core Equipment: SAB83 Series C2C & C2W TCB Bonding Equipment
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Supports C2C (R&D/small batch) and C2W (high volume)
SAB8300 Semi-automatic C2C TCB Bonding Equipment
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Pressure range: 1–3000 N (1–50 N, accuracy ≤ ±0.5 N; 51–3000 N, accuracy ≤ ±2 N)
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Post-bonding accuracy ≤ ±300 nm
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Bond head temperature control: Heating rate ≤ 2.2 s (RT–450°C)
SAB8310 CW Fully Automatic C2W TCB Bonding Equipment
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Pressure range: -30–3000 N (Option 1: -30–500 N, accuracy 0.25 N or 1%; Option 2: 10–3000 N, accuracy ±2 N)
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Post-bonding accuracy ≤ ±500 nm
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Bond head temperature control: Heating rate ≤ 2.2 s (RT–450°C)
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0.4×0.4-50×50 mm
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Chip size
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3000 N
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Maximum bonding force
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±300 nm
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Bonding accuracy
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Supported
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Hydrogen radical activation
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RT-450℃
Rise time ≤2.2 s
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Heating capability
- SAB8300-Semi-automatic
- C2C TCB Bonding Equipment
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Process Capability
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Eutectic bonding (Au-Sn, Au-In) or metal bonding (Au-Au, Cu-Cu) for flip-chip interconnection between LED chips and CMOS wafers.
Core Equipment: SAB83 Series C2C & C2W TCB Bonding Equipment
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Supports C2C (R&D/small batch) and C2W (high volume)
SAB8300 Semi-automatic C2C TCB Bonding Equipment
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Pressure range: 1–3000 N (1–50 N, accuracy ≤ ±0.5 N; 51–3000 N, accuracy ≤ ±2 N)
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Post-bonding accuracy ≤ ±300 nm
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Bond head temperature control: Heating rate ≤ 2.2 s (RT–450°C)
SAB8310 CW Fully Automatic C2W TCB Bonding Equipment
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Pressure range: -30–3000 N (Option 1: -30–500 N, accuracy 0.25 N or 1%; Option 2: 10–3000 N, accuracy ±2 N)
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Post-bonding accuracy ≤ ±500 nm
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Bond head temperature control: Heating rate ≤ 2.2 s (RT–450°C)
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1×1-70×70 mm
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chip size
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8-12 inch
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Wafer size
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3000 N
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Maximum bonding force
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±500 nm
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Bonding accuracy
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Hydrogen radical and plasma activation
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Activation chambers
- SAB8310CW-Fully Automatic
- C2W TCB Bonding Equipment
Core Process 2:W2W Metal Bonding – Room-temperature Bonding
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Process Capability
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Room-temperature bonding achieves a bonding layer thickness of only ~10 nm (vs. hundreds of nm for eutectic bonding), reducing etch difficulty and enabling higher pixel density.
Core Equipment: SAB6110 Fully Automatic UHV RT Bonding Equipment
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Room-temperature direct bonding, no heating needed, eliminating thermal stress
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Full-size compatible bonding
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Precision alignment and pressure control
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Fully automated control and modular design
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High adaptability, enabling flexible control and design of the bonding intermediate layer
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4-12 inch
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Wafer size
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±1%
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Pressure divergence
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2
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Quantity of targets
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≤ ±1 μm
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Bonding accuracy
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WPH≥6
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Throughput
- SAB6110-Fully Automatic
- UHV RT Bonding Equipment
Core Process 3:Collective W2W Hybrid Bonding
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Process Capabilities
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W2W hybrid bonding: vertical stacking enables full-color displays with higher resolution
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C2W hybrid bonding: supports KGD selection and is suitable for scenarios with wafer size mismatch
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Collective W2W hybrid bonding: C2W reconstitution + W2W bonding for higher efficiency
Core Equipment: SAB6210 HB Fully Automatic Hybrid Bonding Equipment
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Supports 8/12 inch wafers
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W2W bonding accuracy ≤ 100 nm / C2W bonding accuracy ≤ 200 nm
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6-12 inch
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Wafer size
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≥2.0 J/m²
Si-SiO₂
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Bonding strength after annealing
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<200 nm
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Bonding accuracy
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WPH≥12
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Throughput
- SAB6210 HB-Fully Automatic
- W2W Hybrid Bonding Equipment
Core Process 4:Epi Layer Transfer
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Process Capabilities
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Transfer GaN epi layers from the original substrate to a (100) ultra-flat Si substrate. Ultra-flat Si offers higher mechanical strength and lower TTV (within 0.5 μm), improving downstream process yield.
Core Equipment: SAB6110 Fully Automatic UHV RT Bonding Equipment
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Room-temperature direct bonding, no heating needed, eliminating thermal stress
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Full-size compatible bonding
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Precision alignment and pressure control
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Fully automated control and modular design
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High adaptability, enabling flexible control and design of the bonding intermediate layer
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4-12 inch
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Wafer size
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±1%
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Pressure divergence
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2
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Quantity of targets
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≤ ±1 μm
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Bonding accuracy
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WPH≥6
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Throughput
- SAB6110-Fully Automatic
- UHV RT Bonding Equipment
- Full-process Coverage
- Flip-chip bonding, room-temperature bonding, and hybrid bonding.
- Advantages of Metal Room-temperature Bonding
- Bonding layer of only ~10 nm, reducing etch difficulty.
- Room-temperature Bonding Enables Epi Layer Transfer
- Reduces bonding stress and improves downstream process yield.
- Wafer Size Matching Solution
- C2W reconstitution + W2W bonding, supporting 4/6/8-inch LED + 8/12-inch CMOS.
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Pixel vehicle light (flip-chip bonding)
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AR glasses (room-temperature bonding, hybrid bonding)
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MicroLED full-color displays