设备特点
规格参数
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ItemsSpecification
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Wafer size4-12 inch
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Bondable materialsSi, LT/LN, Sapphire, InP, SiC, GaAs, GaN, as well as metals, glass, etc.
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Capacity≥12 pairs/h
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Wafer loadCassette
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Maximum pressure100kN
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Sputtering target1
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Alignment accuracy≤±50 μm@edge alignment; ≤±1 μm@mark alignment
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Bonding strengthStandard: Si-Si≥1.5 J/m² @RT
Enhanced: SiO₂-SiO₂≥2 J/m² @RT -
LayoutCluster tool
















